AOI System for iPhone MIC Hole Inspection
Small defect detection · Tight tolerance · High precision
Overview
Inspection pipeline targeting mic-hole region defects with tight tolerance requirements. System handles small features and challenging reflections for reliable quality control.
Problem
- Mic-hole defects are typically very small.
- Tight tolerance requires high detection precision.
- Reflective surfaces create challenging conditions.
- Need for zero false negatives in production.
Solution
- AOI pipeline optimized for small defect detection.
- Improved robustness for small features and reflections.
- High-resolution inspection with precision localization.
- Validated against stringent Apple quality standards.
My Role
- Built AOI pipeline for mic-hole defect detection and validation.
- Improved robustness for small features and reflections.
- Optimized system for production deployment.
Implementation
Language: Python
Libraries:
OpenCV
PyTorch
Results Gallery
Training and evaluation demonstrations are omitted due to data confidentiality.
End Result
- High-precision mic-hole inspection ready for deployment.
- Reliable detection of small defects with tight tolerances.
- Deployed successfully in Apple production line.