Display Chip Inspection System — Samsung SDI
High precision inspection · Defect localization · Industrial QA
Overview
Inspection system for display chips with stringent accuracy and robustness requirements. Vision-based pipeline for chip inspection and defect localization in manufacturing environment.
Problem
- Display chips require extremely high inspection precision.
- Various defect types across chip surface and edges.
- Need for stable performance across manufacturing conditions.
- Stringent false positive/negative rate requirements.
Solution
- Vision pipeline for chip inspection and defect localization.
- Optimized model inference and stability across conditions.
- Robust feature extraction for consistent detection.
- Production-validated performance metrics.
My Role
- Designed vision pipeline for chip inspection and defect localization.
- Optimized model inference and stability across conditions.
- Validated system against Samsung SDI quality requirements.
Implementation
Language: Python
Libraries:
OpenCV
PyTorch
Results Gallery
Training and evaluation demonstrations are omitted due to data confidentiality.
End Result
- Reliable inspection workflow suitable for industrial QA.
- High precision meeting Samsung SDI requirements.
- Stable performance in production environment.